ADVANCED SCANNING PROBE MICROSCOPY
Credit points: 15
In this subject, students will study the principle and practice of operating Scanning Probe Microscopes (SPMs), in particular atomic force microscopy (AFM) scanning tunneling microscopy (STM), and the instrumentation and probes required to implement these techniques. The necessary supporting electronic, vacuum, magnetic, biological, chemical and cryogenic systems will be described and used. Students will also be introduced to the concepts and practice of nanolithography and electrochemical SPM.
FacultyFaculty of Science, Tech & Engineering
Subject Co-ordinatorChanh Tran
Available to Study Abroad StudentsYes
Subject year levelYear Level 5 - Masters
Prerequisites Enrolment in a Master of Nanotechnology single or double degree (SMNT or SZHSNT or SZHSN) or approval of Department of Physics postgraduate co-ordinator.
Incompatible subjects PHY2PM, PHY3SPM
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Melbourne, 2014, Semester 2, Day
Maximum enrolment sizeN/A
Subject Instance Co-ordinatorChanh Tran
One 3.0 hours laboratory class per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.
Two 1.0 hours lecture per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.
|2-hour written end-of-semester exam (short-answer questions)||40|
|Report on research problem (3000 words)||10|
|Three x 15-minute oral presentations||15|
|Three x 3-page written reports on laboratory activities.||15|
|Written project report (10 pages)||20|