ADVANCED SCANNING PROBE MICROSCOPY
PHY5SPA
2014
Credit points: 15
Subject outline
In this subject, students will study the principle and practice of operating Scanning Probe Microscopes (SPMs), in particular atomic force microscopy (AFM) scanning tunneling microscopy (STM), and the instrumentation and probes required to implement these techniques. The necessary supporting electronic, vacuum, magnetic, biological, chemical and cryogenic systems will be described and used. Students will also be introduced to the concepts and practice of nanolithography and electrochemical SPM.
Faculty: Faculty of Science, Tech & Engineering
Credit points: 15
Subject Co-ordinator: Chanh Tran
Available to Study Abroad Students: Yes
Subject year level: Year Level 5 - Masters
Exchange Students: Yes
Subject particulars
Subject rules
Prerequisites: Enrolment in a Master of Nanotechnology single or double degree (SMNT or SZHSNT or SZHSN) or approval of Department of Physics postgraduate co-ordinator.
Co-requisites: N/A
Incompatible subjects: PHY2PM, PHY3SPM
Equivalent subjects: N/A
Special conditions: N/A
Melbourne, 2014, Semester 2, Day
Overview
Online enrolment: Yes
Maximum enrolment size: N/A
Enrolment information:
Subject Instance Co-ordinator: Chanh Tran
Class requirements
Laboratory ClassWeek: 31 - 43
One 3.0 hours laboratory class per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.
LectureWeek: 31 - 43
Two 1.0 hours lecture per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.
Assessments
| Assessment element | Comments | % |
|---|---|---|
| 2-hour written end-of-semester exam (short-answer questions) | 40 | |
| Report on research problem (3000 words) | 10 | |
| Three x 15-minute oral presentations | 15 | |
| Three x 3-page written reports on laboratory activities. | 15 | |
| Written project report (10 pages) | 20 |