ADVANCED SCANNING PROBE MICROSCOPY

PHY5SPA

2014

Credit points: 15

Subject outline

In this subject, students will study the principle and practice of operating Scanning Probe Microscopes (SPMs), in particular atomic force microscopy (AFM) scanning tunneling microscopy (STM), and the instrumentation and probes required to implement these techniques. The necessary supporting electronic, vacuum, magnetic, biological, chemical and cryogenic systems will be described and used. Students will also be introduced to the concepts and practice of nanolithography and electrochemical SPM.

FacultyFaculty of Science, Tech & Engineering

Credit points15

Subject Co-ordinatorChanh Tran

Available to Study Abroad StudentsYes

Subject year levelYear Level 5 - Masters

Exchange StudentsYes

Subject particulars

Subject rules

Prerequisites Enrolment in a Master of Nanotechnology single or double degree (SMNT or SZHSNT or SZHSN) or approval of Department of Physics postgraduate co-ordinator.

Co-requisitesN/A

Incompatible subjects PHY2PM, PHY3SPM

Equivalent subjectsN/A

Special conditionsN/A

Subject options

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Start date between: and    Key dates

Melbourne, 2014, Semester 2, Day

Overview

Online enrolmentYes

Maximum enrolment sizeN/A

Enrolment information

Subject Instance Co-ordinatorChanh Tran

Class requirements

Laboratory Class Week: 31 - 43
One 3.0 hours laboratory class per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.

Lecture Week: 31 - 43
Two 1.0 hours lecture per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.

Assessments

Assessment elementComments%
2-hour written end-of-semester exam (short-answer questions)40
Report on research problem (3000 words)10
Three x 15-minute oral presentations15
Three x 3-page written reports on laboratory activities.15
Written project report (10 pages)20