SCANNING PROBE MICROSCOPY
Credit points: 15
In this subject, students will study the principle and practice of operating Scanning Probe Microscopes (SPMs), in particular atomic force microscopy (AFM) scanning tunneling microscopy (STM), and the instrumentation and probes required to implement these techniques. The necessary supporting electronic, vacuum, magnetic, biological, chemical and cryogenic systems will be described and used. Students will also be introduced to the concepts and practice of nanolithography and electrochemical SPM.
FacultyFaculty of Science, Tech & Engineering
Subject Co-ordinatorDavid Hoxley
Available to Study Abroad StudentsYes
Subject year levelYear Level 3 - UG
Prerequisites PHY1SCA and PHY1SCB or approval from the Department of Physics adviser of studies.
Incompatible subjects PHY2SPM, PHY5SPA
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Melbourne, 2014, Semester 2, Day
Maximum enrolment sizeN/A
Subject Instance Co-ordinatorDavid Hoxley
One 3.0 hours laboratory class per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.
Two 1.0 hours lecture per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.
|One 2-hour written end-of-semester exam (short answer questions)||40|
|Three x 15 minute oral presentations||15|
|Three x 3-page written assignments on laboratory activities||20|
|Written project report (10 pages)||25|