phy5ima advanced imaging and materials characterisation
ADVANCED IMAGING AND MATERIALS CHARACTERISATION
PHY5IMA
Not currently offered
Credit points: 15
Subject outline
On completion of this subject, students will be able to determine chemical and structural properties of materials using the techniques of optical microscopy, electron microscopy, x-ray diffraction, x-ray fluorescence and image analysis. Materials investigated include earth assemblages (minerals and soils) and technological materials such as semiconductors and integrated circuits. Students are also provided with a simple research problem solvable by computational methods, and are expected to solve it individually, in consultation with demonstrators. The approach and results are summarised in a written report. This subject is available to postgraduate students as part of a group of electives which deepen their knowledge of physics and introduce research-related skills.
SchoolMolecular Sciences
Credit points15
Subject Co-ordinatorDongchen Qi
Available to Study Abroad/Exchange StudentsYes
Subject year levelYear Level 5 - Masters
Available as ElectiveNo
Learning ActivitiesN/A
Capstone subjectNo
Subject particulars
Subject rules
Prerequisites Approval from the Department of Physics adviser of studies
Co-requisitesN/A
Incompatible subjectsPHY2IMG
Equivalent subjectsN/A
Quota Management StrategyN/A
Quota-conditions or rulesN/A
Special conditionsN/A
Minimum credit point requirementN/A
Assumed knowledgeN/A
Learning resources
An Introduction to X-ray Spectrometry
Resource TypeBook
Resource RequirementRecommended
AuthorJenkins, R.
Year1974
Edition/VolumeN/A
PublisherHEYDEN
ISBNN/A
Chapter/article titleN/A
Chapter/issueN/A
URLN/A
Other descriptionN/A
Source locationN/A
Principles of Quantitative X-ray Fluorescence Analysis
Resource TypeBook
Resource RequirementRecommended
AuthorTertian, R., Claisse, F.
Year1982
Edition/VolumeN/A
PublisherHEYDEN
ISBNN/A
Chapter/article titleN/A
Chapter/issueN/A
URLN/A
Other descriptionN/A
Source locationN/A
Fundamentals of Energy Dispersive X-ray Analysis
Resource TypeBook
Resource RequirementRecommended
AuthorRuss, J.C.
Year1984
Edition/VolumeN/A
PublisherBUTTERWORTHS
ISBNN/A
Chapter/article titleN/A
Chapter/issueN/A
URLN/A
Other descriptionN/A
Source locationN/A
An Introduction to X-ray Spectrometry: X-ray Fluorescence and Electron Microprobe Analysis
Resource TypeBook
Resource RequirementRecommended
AuthorWilliams, K.L.
Year1987
Edition/VolumeN/A
PublisherLONDON; BOSTON: ALLEN & UNWIN
ISBNN/A
Chapter/article titleN/A
Chapter/issueN/A
URLN/A
Other descriptionN/A
Source locationN/A
The Image Processing Handbook
Resource TypeBook
Resource RequirementRecommended
AuthorRuss, J.C.
Year1995
Edition/VolumeN/A
PublisherBOCA RATON: CRC PRESS
ISBNN/A
Chapter/article titleN/A
Chapter/issueN/A
URLN/A
Other descriptionN/A
Source locationN/A
Elements of X-ray Diffraction
Resource TypeBook
Resource RequirementRecommended
AuthorCullity, B.D.
Year1977
Edition/VolumeN/A
PublisherADDISON-WESLEY
ISBNN/A
Chapter/article titleN/A
Chapter/issueN/A
URLN/A
Other descriptionN/A
Source locationN/A
Electron Probe Quantitation
Resource TypeBook
Resource RequirementRecommended
AuthorHeinrich, K.F.J. & Newbury, D.E.
Year1991
Edition/VolumeN/A
PublisherNEW YORK: PLENUM PRESS
ISBNN/A
Chapter/article titleN/A
Chapter/issueN/A
URLN/A
Other descriptionN/A
Source locationN/A
Computer-assisted Microscopy: the Measurement and Analysis of Images
Resource TypeBook
Resource RequirementRecommended
AuthorRuss, J.C.
Year1990
Edition/VolumeN/A
PublisherNEW YORK: PLENUM PRESS
ISBNN/A
Chapter/article titleN/A
Chapter/issueN/A
URLN/A
Other descriptionN/A
Source locationN/A
Career Ready
Career-focusedNo
Work-based learningNo
Self sourced or Uni sourcedN/A
Entire subject or partial subjectN/A
Total hours/days requiredN/A
Location of WBL activity (region)N/A
WBL addtional requirementsN/A
Graduate capabilities & intended learning outcomes
Graduate Capabilities
Intended Learning Outcomes
Subject options
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