ADVANCED IMAGING AND MATERIALS CHARACTERISATION
PHY5IMA
Not currently offered
Credit points: 15
Subject outline
On completion of this subject, students will be able to determine chemical and structural properties of materials using the techniques of optical microscopy, electron microscopy, x-ray diffraction, x-ray fluorescence and image analysis. Materials investigated include earth assemblages (minerals and soils) and technological materials such as semiconductors and integrated circuits. Students are also provided with a simple research problem solvable by computational methods, and are expected to solve it individually, in consultation with demonstrators. The approach and results are summarised in a written report. This subject is available to postgraduate students as part of a group of electives which deepen their knowledge of physics and introduce research-related skills.
School: Molecular Sciences (Pre 2022)
Credit points: 15
Subject Co-ordinator: Dongchen Qi
Available to Study Abroad/Exchange Students: Yes
Subject year level: Year Level 5 - Masters
Available as Elective: No
Learning Activities: N/A
Capstone subject: No
Subject particulars
Subject rules
Prerequisites: Approval from the Department of Physics adviser of studies
Co-requisites: N/A
Incompatible subjects: PHY2IMG
Equivalent subjects: N/A
Quota Management Strategy: N/A
Quota-conditions or rules: N/A
Special conditions: N/A
Minimum credit point requirement: N/A
Assumed knowledge: N/A
Learning resources
An Introduction to X-ray Spectrometry
Resource Type: Book
Resource Requirement: Recommended
Author: Jenkins, R.
Year: 1974
Edition/Volume: N/A
Publisher: HEYDEN
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Principles of Quantitative X-ray Fluorescence Analysis
Resource Type: Book
Resource Requirement: Recommended
Author: Tertian, R., Claisse, F.
Year: 1982
Edition/Volume: N/A
Publisher: HEYDEN
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Fundamentals of Energy Dispersive X-ray Analysis
Resource Type: Book
Resource Requirement: Recommended
Author: Russ, J.C.
Year: 1984
Edition/Volume: N/A
Publisher: BUTTERWORTHS
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
An Introduction to X-ray Spectrometry: X-ray Fluorescence and Electron Microprobe Analysis
Resource Type: Book
Resource Requirement: Recommended
Author: Williams, K.L.
Year: 1987
Edition/Volume: N/A
Publisher: LONDON; BOSTON: ALLEN & UNWIN
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
The Image Processing Handbook
Resource Type: Book
Resource Requirement: Recommended
Author: Russ, J.C.
Year: 1995
Edition/Volume: N/A
Publisher: BOCA RATON: CRC PRESS
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Elements of X-ray Diffraction
Resource Type: Book
Resource Requirement: Recommended
Author: Cullity, B.D.
Year: 1977
Edition/Volume: N/A
Publisher: ADDISON-WESLEY
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Electron Probe Quantitation
Resource Type: Book
Resource Requirement: Recommended
Author: Heinrich, K.F.J. & Newbury, D.E.
Year: 1991
Edition/Volume: N/A
Publisher: NEW YORK: PLENUM PRESS
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Computer-assisted Microscopy: the Measurement and Analysis of Images
Resource Type: Book
Resource Requirement: Recommended
Author: Russ, J.C.
Year: 1990
Edition/Volume: N/A
Publisher: NEW YORK: PLENUM PRESS
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Career Ready
Career-focused: No
Work-based learning: No
Self sourced or Uni sourced: N/A
Entire subject or partial subject: N/A
Total hours/days required: N/A
Location of WBL activity (region): N/A
WBL addtional requirements: N/A