IMAGING AND MATERIALS CHARACTERISATION

PHY2MAC

2020

Credit points: 15

Subject outline

On completion of this subject, you will be able to determine chemical and structural properties of materials using the techniques of optical microscopy, electron microscopy, x-ray diffraction, x-ray fluorescence and image analysis. Materials investigated include earth assemblages (minerals and soils and technological materials such as semi conductors and integrated circuits. You will gain discipline based knowledge and skills in preparation for a career in physical and earth sciences

School: Molecular Sciences (Pre 2022)

Credit points: 15

Subject Co-ordinator: Paul Pigram

Available to Study Abroad/Exchange Students: Yes

Subject year level: Year Level 2 - UG

Available as Elective: No

Learning Activities: N/A

Capstone subject: No

Subject particulars

Subject rules

Prerequisites: CHE1GEN OR PHY1SCA OR CHE1APL OR PHY1LS OR CHE1CHF OR PHY1SCB

Co-requisites: N/A

Incompatible subjects: PHY2IMG

Equivalent subjects: N/A

Quota Management Strategy: N/A

Quota-conditions or rules: N/A

Special conditions: N/A

Minimum credit point requirement: N/A

Assumed knowledge: N/A

Learning resources

An introduction to X-ray spectrometry

Resource Type: Book

Resource Requirement: Recommended

Author: R. Jenkins

Year: 1974

Edition/Volume: N/A

Publisher: Heyden

ISBN: N/A

Chapter/article title: N/A

Chapter/issue: N/A

URL: N/A

Other description: N/A

Source location: N/A

Elements of X-ray diffraction

Resource Type: Book

Resource Requirement: Recommended

Author: B. D. Cullity

Year: 1977

Edition/Volume: N/A

Publisher: Addison-Wesley

ISBN: N/A

Chapter/article title: N/A

Chapter/issue: N/A

URL: N/A

Other description: N/A

Source location: N/A

The image processing handbook

Resource Type: Book

Resource Requirement: Recommended

Author: J.C. Russ

Year: 1995

Edition/Volume: N/A

Publisher: Boca Raton:CRC Press

ISBN: N/A

Chapter/article title: N/A

Chapter/issue: N/A

URL: N/A

Other description: N/A

Source location: N/A

Fundamentals of energy dispersive X-ray analysis

Resource Type: Book

Resource Requirement: Recommended

Author: J.C. Russ

Year: 1984

Edition/Volume: N/A

Publisher: Butterworths

ISBN: N/A

Chapter/article title: N/A

Chapter/issue: N/A

URL: N/A

Other description: N/A

Source location: N/A

Career Ready

Career-focused: No

Work-based learning: No

Self sourced or Uni sourced: N/A

Entire subject or partial subject: N/A

Total hours/days required: N/A

Location of WBL activity (region): N/A

WBL addtional requirements: N/A

Graduate capabilities & intended learning outcomes

Graduate Capabilities

Intended Learning Outcomes

01. Analyse and/or solve conceptual and numerical problems related to imaging and materials characterisation.
02. Develop hands-on experience in techniques used in materials characterisation following instrument manuals and/ or standard operating procedure.
03. Critically review and analyse experimental data and interpret the results with reference to the scientific literature.
04. Communicate key findings from experimental investigations in the form of a detailed written report.

Melbourne (Bundoora), 2020, Semester 2, Day

Overview

Online enrolment: Yes

Maximum enrolment size: N/A

Subject Instance Co-ordinator: Paul Pigram

Class requirements

Laboratory ClassWeek: 32 - 43
Seven 3.00 hours laboratory class per study period on weekdays during the day from week 32 to week 43 and delivered via face-to-face.

LectureWeek: 31 - 43
One 2.00 hours lecture per week on weekdays during the day from week 31 to week 43 and delivered via face-to-face.

Assessments

Assessment elementCommentsCategoryContributionHurdle%ILO*

2 hour end-of-semester written exam (2000 word equiv)

N/AN/AN/ANo60SILO1, SILO3

Extended Lab report collated from multiple laboratory sessions (2000 word equiv)Students characterise the physical properties of a nanomaterial sample using a range of techniques and present the findings in a written report in the format of a journal article.

N/AN/AN/ANo30SILO2, SILO3, SILO4

4 x Image analysis assignments (500 word equiv total)

N/AN/AN/ANo10SILO1, SILO3