IMAGING AND MATERIALS CHARACTERISATION
PHY2IMG
Not currently offered
Credit points: 15
Subject outline
On completion of this subject, students will be able to determine chemical and structural properties of materials using the techniques of optical microscopy, electron microscopy, x-ray diffraction, x-ray fluorescence and image analysis. Materials investigated include earth assemblages,(minerals and soils) and technological materials such as semiconductors and integrated circuits.
School: Molecular Sciences (Pre 2022)
Credit points: 15
Subject Co-ordinator: Dongchen Qi
Available to Study Abroad/Exchange Students: Yes
Subject year level: Year Level 2 - UG
Available as Elective: No
Learning Activities: N/A
Capstone subject: No
Subject particulars
Subject rules
Prerequisites: PHY1LSA OR CHE1APL OR CHE1CHF OR PHY1SCB OR PHY1SCA OR CHE1BAS OR CHE1GEN OR PHY1LSB
Co-requisites: N/A
Incompatible subjects: N/A
Equivalent subjects: N/A
Quota Management Strategy: N/A
Quota-conditions or rules: N/A
Special conditions: N/A
Minimum credit point requirement: N/A
Assumed knowledge: N/A
Learning resources
An introduction to X-ray spectrometry
Resource Type: Book
Resource Requirement: Recommended
Author: Jenkins, R.
Year: 1974
Edition/Volume: N/A
Publisher: HEYDEN
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
An introduction to X-ray spectrometry: X-ray fluorescence and electron microprobe analysis
Resource Type: Book
Resource Requirement: Recommended
Author: Williams, K. L
Year: 1987
Edition/Volume: N/A
Publisher: LONDON; BOSTON: ALLEN & UNWIN
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Principles of quantitative X-ray fluorescence analysis
Resource Type: Book
Resource Requirement: Recommended
Author: Tertian, R., Claisse, F.
Year: 1982
Edition/Volume: N/A
Publisher: HEYDEN
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Electron probe quantitation
Resource Type: Book
Resource Requirement: Recommended
Author: Heinrich, K.F.J. & Newbury, D. E.
Year: 1991
Edition/Volume: N/A
Publisher: NEW YORK: PLENUM PRESS
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Elements of X-ray Diffraction
Resource Type: Book
Resource Requirement: Recommended
Author: Cullity, B. D.
Year: 1977
Edition/Volume: N/A
Publisher: ADDISON-WESLEY
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Computer-assisted microscopy: the measurement and analysis of images
Resource Type: Book
Resource Requirement: Recommended
Author: Russ, J. C.
Year: 1990
Edition/Volume: N/A
Publisher: NEW YORK: PLENUM PRESS
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Fundamentals of energy dispersive x-ray analysis
Resource Type: Book
Resource Requirement: Recommended
Author: Russ, J. C.
Year: 1984
Edition/Volume: N/A
Publisher: BUTTERWORTHS
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
The image processing handbook
Resource Type: Book
Resource Requirement: Recommended
Author: Russ, J. C.
Year: 1995
Edition/Volume: N/A
Publisher: BOCA RATON: CRC PRESS
ISBN: N/A
Chapter/article title: N/A
Chapter/issue: N/A
URL: N/A
Other description: N/A
Source location: N/A
Career Ready
Career-focused: No
Work-based learning: No
Self sourced or Uni sourced: N/A
Entire subject or partial subject: N/A
Total hours/days required: N/A
Location of WBL activity (region): N/A
WBL addtional requirements: N/A