Centre for Materials and Surface Science
Surface Analysis
Contemporary surface analytical techniques allows the elemental composition, chemistry and molecular structure of the outermost layers of solid surfaces to be determined. Surfaces play a key role in the manufacture and processing of many products. Surface analysis can be used to examine materials including metals, polymers, biomaterials, textiles, semiconductors, ceramics and glass. It can identify changes in composition with time, spatial location and depth. Surface analysis is an essential practical tool for the research laboratory and for the improvement of manufacturing technologies, enhanced quality control and R&D tasks.
The Advanced Surface Imaging and Spectroscopy Facility was established in Melbourne in 1999 as a joint venture between the Centre for Materials and Surface Science (CMSS), La Trobe University and a number of Victorian universities, research organisations and manufacturers. The Facility services the research requirements of scientists and industries and offers commercial surface analytical services.
CMSS activities
Education and training
- University programs - undergraduate courses and postgraduate research projects
- Workshop programs for industry
Collaborative activities
- Promotion of co-operative activities between local and international research and industrial organisations
Commercial surface analysis activities
The Centre hosts Australia's most comprehensive surface science capability featuring a range of custom built ultrahigh vacuum instrumentation, synchrotron end stations, and modern surface analytical instrumentation
X-ray photoelectron spectroscopy (XPS) |
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Kratos Analytical Ultra DLD XPS instrument |
- elemental and chemical state information from the outermost 5 - 10 nm of the sample surface
- spectroscopy, imaging and depth profiling to 1 µm
- monochromated Al ka X-ray source; Mg/Al dual anode X-ray source
- heating and cooling in the load lock and at the analysis position
- radial distribution chamber for UHV sample transfers to two sample preparation chambers
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Kratos Analytical Nova XPS instrument |
- elemental and chemical state information from the outermost 5 - 10 nm of the sample surface
- spectroscopy, imaging and depth profiling to 1 µm
- monochromated Al ka X-ray source
- capacity to up to 150 samples and automated operations; high throughput
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Time of flight secondary ion mass spectrometry (ToF-SIMS) |
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Ion ToF GmbH ToF-SIMS IV instrument
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- molecular information from the outermost layers of the sample surface
- spectroscopy, imaging and depth profiling to 10 µm
- large sample platen (100 mm)
- Bi liquid metal cluster ion source
- Cs/O dual source column for depth profiling
- Oxygen flood
- heating and cooling in the load lock and at the analysis position
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Atomic force microscopy (AFM) |
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Asylum Research MFP-3D-BIO AFM instrument
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- 90 µm XY scan stage mounted on a Nikon inverted optical microscope
- Operating modes:
- contact
- non-contact
- AC
- electrical, magnetic, frictional force
- fluid environments including electrochemical SPM
- Instrument housed in a TMC acoustic enclosure
- Mounted on a Herzan active damping table
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Asylum Research MFP-3D-SA AFM instrument
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- 90 µm XY scan stage optimised for non-transparent samples
- Operating modes:
- contact
- non-contact
- AC
- electrical, magnetic, frictional force
- fluid environments including electrochemical SPM
- Instrument housed in a TMC acoustic enclosure
- Mounted on a Herzan active damping table
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Contact the Centre for more information about access programs for researchers and for industry
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