Capabilities and facilities

The Centre hosts Australia's most comprehensive surface science capability, featuring a range of custom built ultrahigh vacuum instrumentation, synchrotron end stations, and modern surface analytical instrumentation. Contemporary surface analytical techniques allow the elemental composition, chemistry and molecular structure of the outermost layers of solid surfaces to be determined.

Australian Synchrotron 

Through La Trobe's synchrotron program, CMSS members, students and clients have priority access to the Australian Synchrotron.

X-ray science

La Trobe's X-ray science group conduct in-depth research into a number of specialised areas to develop novel imaging and X-ray based characterisation techniques.

Surface analysis 

Surfaces play a key role in the manufacture and processing of many products. Surface analysis can be used to examine materials including metals, polymers, biomaterials, textiles, semiconductors, ceramics and glass. It can also identify changes in composition with time, spatial location and depth.

Surface analysis is an essential practical tool for the research laboratory and for the improvement of manufacturing technologies, enhanced quality control and R&D tasks.

There are many applications of surface science that can benefit your organisation.  

Equipment

X-ray photoelectron spectroscopy (XPS)

Kratos Analytical Ultra DLD XPS instrument

  • elemental and chemical state information from the outermost 5 - 10 nm of the sample surface
  • spectroscopy, imaging and depth profiling to 1 µm
  • monochromated Al ka X-ray source; Mg/Al dual anode X-ray source
  • heating and cooling in the load lock and at the analysis position
  • radial distribution chamber for UHV sample transfers to two sample preparation chambers

Kratos Analytical Nova XPS instrument

  • elemental and chemical state information from the outermost 5 - 10 nm of the sample surface
  • spectroscopy, imaging and depth profiling to 1 µm
  • monochromated Al ka X-ray source
  • capacity to up to 150 samples and automated operations; high throughput
  • Time of flight secondary ion mass spectrometry (ToF-SIMS)

Time of flight secondary ion mass spectrometry (ToF-SIMS)

Ion ToF GmbH ToF-SIMS IV instrument

  • molecular information from the outermost layers of the sample surface
  • spectroscopy, imaging and depth profiling to 10 µm
  • large sample platen (100 mm)
  • Bi liquid metal cluster ion source
  • Cs/O dual source column for depth profiling
  • Oxygen flood
  • heating and cooling in the load lock and at the analysis position

Atomic force microscopy (AFM)

Asylum Research MFP-3D-BIO AFM instrument

  • 90 µm XY scan stage mounted on a Nikon inverted optical microscope
  • Operating modes:
    • contact
    • non-contact
    • AC
    • electrical, magnetic, frictional force
    • fluid environments including electrochemical SPM
  • Instrument housed in a TMC acoustic enclosure
  • Mounted on a Herzan active damping table

Asylum Research MFP-3D-SA AFM instrument

  • 90 µm XY scan stage optimised for non-transparent samples
  • Operating modes:
    • contact
    • non-contact
    • AC
    • electrical, magnetic, frictional force
    • fluid environments including electrochemical SPM
  • Instrument housed in a TMC acoustic enclosure
  • Mounted on a Herzan active damping table