X-ray optics and interactions of x-rays with matter
Group leader
Dr Chanh Tran
Lecturer, Faculty of Science, Technology and Engineering
Research interests: X-ray optics and interactions of X-rays with matters:
- X-ray optics and synchrotron science
- Coherence studies
- X-ray imaging
- X-ray interferometry
- Precision measurements of the interaction cross-sections of X-rays with matter.
X-Ray Coherence and Imaging
Figure 1
This research program will apply techniques such as Phase Space Tomography [Opt. Lett. 30 204-206 (2005); JOSA A 22 1691 (2005); Phys. Rev. Lett. 98, 224801 (2007)] to develop state-of-the-art X-ray imaging techniques in which all the information about an object encoded in a partially incoherent wavefield can be decoded or reconstructed.
Figure 1: Complete reconstruction of the phase-space correlation function of an X-ray wavefield defined by a 1D single slit.
X-ray interferometry
Figure 2
Figure 2: Two-dimensional interference intensity distribution of an X-ray beam defined by four square pinholes. Profiles and positions of the interference peaks are very sensitive to, and can be used to reconstruct the complex refractive index profile of an object inserted in one of the pinholes.
Elemental Contrast Full-Field Imaging
Figure 3
Figure 3: (Left) An intensity image of a 2 component sample. (Right) Reconstruction of the projected thickness of a single element of the compound sample using this technique.
The method can be incorporated to various techniques of X-ray full-field imaging and therefore promises a wide range of applications.
Elemental contrast tomography
This project aims to explore the application of Elemental Contrast Full-Field Imaging to X-ray tomography. The development of this combined technique provides a unique tool to achieve 3D elemental contrast of compound samples and therefore promises great uses in many important research areas including manufacturing, material sciences, mining industry and cellulous studies.
Interaction of x-rays with matter (photo-absorption, scattering, fluorescence)
Figure 4
We have developed a novel experimental technique called the X-ray Extended Range Technique (XERT) for accurately determining these cross-sections. The project will apply XERT in the investigation of the angular dependence of X-ray scattering which probes wavefunction distributions, bonding, shake-up and shake-down processes and which is at the forefront of much modern atomic physics.
Figure 4: Discrepancies in the total attenuation coefficient of silicon between our work using the XERT (solid circles), other experiments (symbols) and theories (lines). The significance of the results was discussed in Phys. Rev. Letts., 90, 257401 (2003).


