Transmission Electron Microscopes
JEOL JEM-2010HC
The JEOL JEM-2010HC transmission electron microscope is principally used in the analysis of thin section of both biological and polymers. This instrument operates at accelerating voltage of up to 200kV, suitable for the analysis of a large range of different materials. The JEOL 2010 is equipped with an OLYMPUS VELETA CCD camera for digital image acquisition.
Instrument features
- Accelerating voltage: 200kV
- Digital image acquisition
- Olympus Veleta TEM CCD camera
- LaB6 filament
- JEOL double tilt specimen holder
- High contrast and high resolution imaging capabilities
JEOL JEM-1200ex STEM/TEM
The JEOL JEM-1200ex transmission electron microscope is principally used in the analysis of thin section of both biological and materials science. This instrument operates at accelerating voltage of up to 120kV, suitable for the analysis of a large range of different materials. An energy dispersive x-ray analyser allows qualitative and quantitative analysis to be performed.
Instrument features
- 60-120 kV accelerating voltage
- High resolution image with 0.45nm point resolution
- Oxford Instruments LINK Mod.6251, EDS detector for chemical analysis of elements with Z >=5. Resolution 136eV at 5.9keV (EDX/EDS)
- TEM image acquisition on film
- Electron diffraction
- STEM digital image acquisition of bright field, dark field and elemental images
- Qualitative and quantitative elemental analysis and elemental mapping