Scanning Probe Microscopes
NT-MDT NTEGRA AFM/STM
The NT-MDT NTEGRA highly customizable Atomic Force Microscope platform enables operation with a broad range of working modes, for applications ranging from life sciences to materials and surface science. These applications are supported by a number of additional instrument options that allows the measurement to be performed in small specimen scan-by-sample or large specimen scan-by-probe configurations. In addition to the basic AFM working modes (contact and semicontact AKA tapping, in air and in liquid), Scanning Tunnel Microscopy (STM) is also available.
Instrument features
- Lateral Force / Phase Imaging,
- Force Modulation,
- Adhesion Force Imaging,
- Magnetic Force Imaging,
- Electrostatic Force Imaging,
- Capacitance Microscopy,
- Kelvin Probe Microscopy,
- Spreading Resistance Imaging,
- Acoustic Microscopy (AFAM),
- Lithography (force, current),
- etc.